A Fully-statistical Wave Scattering Model for Heterogeneous Surfaces

Zhengze Liu , Yuchi Huo , Yifan Peng , Rui Wang

ACM Transactions on Graphics (Proceedings of SIGGRAPH 2025)
Teaser for A Fully-statistical Wave Scattering Model for Heterogeneous Surfaces

Abstract

Heterogeneous surfaces exhibit spatially varying geometry and material, and therefore admit diverse appearances. Existing computer graphics works can only model heterogeneity using explicit structures or statistical parameters that describe a coarser level of detail. We extend the boundary by introducing a new model that describes the heterogeneous surfaces fully statistically at the microscopic level, with rich geometry and material details that are comparable to the wavelengths of light. We treat the heterogeneous surfaces as a mixture of stochastic vector processes. And we adapt the well-known generalized Harvey-Shack theory to quantify the mean scattered intensity, i.e., the BRDF of these surfaces.

We further explore the covariance statistic of the scattered field and derive its rank-1 decomposition. This leads to a practical algorithm that samples the speckles (fluctuated intensities) from the statistics, enriching the appearance without explicit definition of heterogeneous surfaces. The formulations are analytic and we validate the quantities by comprehensive numeric simulations. Our heterogeneous surface model demonstrates various applications including corrosion (natural), particle deposition (man-made), and height-correlated mixture (artistic).

Citation

@article{10.1145/3730828,
  author = {Liu, Zhengze and Huo, Yuchi and Peng, Yifan and Wang, Rui},
  title = {A Fully-statistical Wave Scattering Model for Heterogeneous Surfaces},
  year = {2025},
  issue_date = {August 2025},
  publisher = {Association for Computing Machinery},
  address = {New York, NY, USA},
  volume = {44},
  number = {4},
  issn = {0730-0301},
  doi = {10.1145/3730828},
  journal = {ACM Trans. Graph.},
  month = jul,
  articleno = {135},
  numpages = {17},
  keywords = {heterogeneous surface, random process, wave optics, scatter, BRDF, speckle, decomposition}
}